Scanning Electron Microscopy and X-Ray Microanalysis Third Edition
3.000,00 TL
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a greDevamını oku
Tek kitap kargo ücreti: 119.00 TL (KDV dahil)
2 ve daha fazla kitap: 129,00 TL (KDV dahil)
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Açıklama
In the decade since the publication of the second edition of Scanning Electron Microscopy and X-Ray Microanalysis, there has been a great expansion in the capabilities of the basic scanning electron microscope (SEM) and the x-ray spectrometers. The emergence of the variab- pressure/environmental SEM has enabled the observation of samples c- taining water or other liquids or vapor and has allowed for an entirely new class of dynamic experiments, that of direct observation of che- cal reactions in situ. Critical advances in electron detector technology and computer-aided analysis have enabled structural (crystallographic) analysis of specimens at the micrometer scale through electron backscatter diffr- tion (EBSD). Low-voltage operation below 5 kV has improved x-ray spatial resolution by more than an order of magnitude and provided an effective route to minimizing sample charging.
690 sayfa. 18x25 cm.
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